Investing substantially in state-of-the-art testing technology allows Elma Bustronic to deliver the quality our customers have come to expect. Testing systems include driver hardware and test-point electronics in extremely high-density packaging, which enable full, simultaneous testing of dense, high pin-count connectors on backplane slots. The network connection allows engineers to download and upload test programs without disrupting backplane testing, making the process virtually seamless.
Characterization and Modeling
A useful interconnect model for backplane based architectures would include the entire backplane path as well as the two connector interfaces and their required supporting via structure on both boards.
PICMG 3.0 Simulations
Eye Diagram
When designing a backplane, the SI Engineer needs to make sure the measured eye opening results exceed the mask from the Tx/Rx spec.
|